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HOME: PAPERS, PRESENTATIONS, AND REFERENCE MATERIALS

REFERENCE MATERIALS
SPACE RADIATION EFFECTS ON MICROELECTRONICS - 514 RAD COURSE
Entire presentation (1.4 Mb)

JPL DERATING GUIDELINES (JPL Users Only)
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JPL A/D SELECTION GUIDE
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MEMS RELIABILITY ASSURANCE GUIDELINES FOR SPACE APPLICATIONS
Entire presentation (3.0 Mb)
GENERAL PAPERS & PRESENTATIONS
  2008  
Roosta, R. Parts User Group Meeting regarding FPGAs and ASICS. 2008
Schone, H. 514 All Hands Meeting - April '08 2008
  2005  
Roosta, R. Design of a Hardware/Software Platform for a Comprehensive Dynamic Burn-In Test of SRAM-Based Field Programmable Gate Arrays 2005
  2004  
Chen, Y. A Chip and Pixel Qualification Methodology on Imaging Sensors (IEEE Reliability and Physics Symposium - Phoenix)
2004
  2003  
White, M. JPL Derating Guidelines JPL-D-8545 Rev. C Overview 2003
  2002  
Kayali, S. Utilization of COTS Electronics in Space Application, Reliability Challenges and Reality
 2002
Petkov, M. A Model for Comprehensive Studies of Porosity in Mesoporous Low-K Dielectrics
 2002
Petkov, M. Experimental and theoretical aspects of electric-field-assisted positron kinetics in metal-oxide-silicon systems 2002
Kayali, S. Reliability and Radiation Hardness of Compound Semiconductors 2002
Petkov, M. Radiation Effects in Low Dielectric Constant Methyl Silsesquioxane Films
2002
  2001  
Kim, Q Advanced Laser Scanner for the Simulation of Cosmic Ray Effects on Microelectronic Devices
2001
Leon, R. Electromigration Failure in Au and Joule Heating Induced Oxidation in Cu Conductors - Part 1
2001
Leon, R. Electromigration Failure in Au and Joule Heating Induced Oxidation in Cu Conductors - Part 2
2001
Leon, R. Electromigration Failure in Au and Joule Heating Induced Oxidation in Cu Conductors - Part 3
2001
  2000  
Kayali, S. Compound Semiconductor Devices for Space Applications
2000
Kayali, S. Electronic Parts Evaluation Activities_2000
2000
Kayali, S. Reliability Challenges for the Utilization of Non-Volatile Memories in Space Systems
2000
Kayali, S. Compound Semiconductor Devices for Space Applications (presentation version)
2000
Leon, R. Adatom Condensation and Quantum Dot Sizes in InGaAs/GaAs
2000
Lin, G. 3D MEMS in Standard Processes: Fabrication, Quality Assurance, and Novel Measurement Microstructures
2000
Leon, R. Radiation effects in nanostructures: Comparison of proton irradiation induced changes on Quantum Dots and Quantum Wells
2000
Phinney, L. Surface Properties of Micromachined Polycrystalline Sillicon Structures
2000
Kayali, S. Reliability Considerations for Advanced Microelectronics
2000
  1999  
Kayali, S. Electronics for Extreme Environments
1999
Kayali, S. MEMS Reliability Assurance Activities at JPL - GOMAC '99
1999
Kim, Q. Infrared Emission Spectroscopy as a Reliability Tool
1999
Leon, R. Effects of Non-Hermeticity in Space-Relevant III-V Devices
1999
Leon, R. Effects of humidity on non-hermetically packaged III-V structures and devices (ppt)
1999
Leon, R. Effects of humidity on non-hermetically packaged III-V structures and devices (pdf)
1999
  Other  
Kim, Q. A Novel, High Resolution, Non-Contact Channel Temperature Measurement Technique
1998
Kim, Q. Wafer-Level Damage Assessment by Test Structures
1996
Kayali, S. Reliability and Qualification of III-V Semiconductor Devices for Space Applications
-
Kayali, S. Reliability of Compound Semiconductor Devices for Space Applications
-
Kim, Q. Microchannel Gate Temperature Analysis
-
Kim, Q. Space Qualification Test of a-Silicon Solar Cell Modules
-
Leon, R. Enhanced Degradation Resistance of Quantum Dot Lasers to Radiation Damage
-
Leon, R. Changes in Luminescence Emission Induced by Proton Irradiation: InGaAs/GaAs Quantum Wells and Quantum Dots
-
Leon, R. Growth evolution, adatom condensation, and island sizes in InGaAs/GaAs
-
Wellman, J. TEM Study of InGaAs/GaAs Structural Evolution Near the Stranski-Krastanow Transformation
-
Leon, R. Microstructural Evolution near the InGaAs/GaAs Stranski-Krastanow Transformation
-
Lawton, R. Micro Nano Technology Visualization (MNTV) of Micromachined MEMS Polysilicon Structures
-

RADIATION EFFECTS GROUP PUBLICATIONS
  2008  
Allen, G Compendium of Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory ( Poster ) 2008
Allen, G VIRTEX-4VQ STATIC SEU CHARACTERIZATION SUMMARY 2008
  2005  
Swift, G Complex Upset Mitigation Applied to a Re-confi gurable Embedded Processor 2005
  2004  
Swift, G Xilinx Single Event Effects 1st Consortium Report: Virtex-II Static SEU Characterization 2004
Irom, F. Single-Event Upset in Highly Scaled Commercial Silicon-on-Insulator PowerPC Microprocessors (Radecs '04) 2004
Irom, F. Frequency Dependence of Single-Event Upset in Advanced Commercial PowerPC Microprocessors (NSREC 2004) 2004
Scheick, L. Displacement Damage Induced Catastrophic Second Breakdown in SiC Power Diodes (NSREC 2004) 2004
Scheick, L. Measurement of Device Parameters Using Image Recovery Techniques in Large-Scale IC Devices (NSREC 2004) 2004
Swift, G. Dynamic Testing of the Xilinx Virtex-II Family Input Output Blocks (IOBs) (NSREC 2004) 2004
Becker, H.

Proton Damage in LEDs with Wavelengths Above the Silicon Wavelength Cutoff (NSREC 2004)

2004
Becker, H. Relative Degradation of Near Infrared Avalanche Photodiodes from Proton Degradation (NSREC 2004) 2004
Johnston, A. Radiation Degradation Mechanisms in Laser Diodes (NSREC 2004) 2004
  2003  
Swift, G. Space Processor Radiation Mitigation and Validation Techniques for an 1800 MIPS Processor Board (RADECS 03) 2003
Scheick, L. Hot Pixel Generation in Active Pixel Sensors: Dosimetric and Microdosimetric response (RADECS 03) 2003
Swift, G. In-flight Annealing of Displacement Damage in GaAs LEDs: A Galileo Story (NSREC 03) 2003
Becker, H. The Influence of Structural Characteristics on the Response of Silicon Avalanche Photodiodes to Proton Irradiation (NSREC 03) 2003
McClure, S. Continuing Evaluation of Bipolar, Linear Devices for Total Dose Bias Dependency and ELDRS Effects (NSREC 03) 2003
Nguyen, D. Total Dose, Single Event, and Radiation-Induced Single-Cell Failures n Advanced Flash Memories (NSREC 03) 2003
Pritchard, B. Recent Radiation Test Results at JPL (NSREC 03) 2003
Selva, L. Catastrophic SEE in High-Voltage Power MOSFETs (NSREC 03) 2003
Shojah-Ardalan, S. Susceptibility of “Ultracapacitors” to Proton and Gamma Irradiation (NSREC 03) 2003
Yui, C. SEU Mitigation of Xilinx Virtex II FPGAs for Critical Flight Applications (NSREC 03) 2003
  2002  
Becker, H. Latent Damage from Single-Event Latchup 2002
Becker, H. Latent Damage in CMOS Devices from Single-Event Latchup 2002
Irom, F. Single Event Upset in the Power PC 7400 Microprocessor 2002
Irom, F. Single-Event Upset in Commercial Silicon-on-Insulator PowerPC Microprocessors 2002
Johnston, A. Single Event Transients in High-Speed Comparators 2002
Lehman, J. Low Dose Failures of Hardened DC-DC Power Converters 2002
McClure, S. Radiation Effects in MicroElectroMechanical Systems (MEMS): RF Relays 2002
Miyahira, T. Trends in Optocoupler Radiation Degradation 2002
Nguyen, D. SEE and TID of Emerging Non-Volatile Memories 2002
Patterson, Jeff Modeling the Contribution of Diffusion to Device Upset Cross Sections 2002
Pritchard, B. Radiation Effects Predicted, Observed, and Compared for Systems in Space 2002
Scheick, L. Dose and Microdose Measurement based on Threshold Shifts in MOSFET arrays in Commercial SRAMS 2002
Scheick, L. Dosimetry & Microdosimetry Using COTS: A Comparative Study 2002
Swift, G. Validation of an SEU Simulation Technique for a Complex Processor:PowerPC7400 2002
Yui, C. Total Dose Dependency and ELDRS Effects on Bipolar Linear Devices 2002
Yui, C. Single Event Upset Susceptibility Testing of the Xilinx Virtex II FPGA 2002
  2001  
Becker, H. Study of Catastrophic Latchup in the DSP2100 Signal Processor Chip for MLS 2001
Conley, J. Heavy Ion Induced Soft Breakdown of Thin Gate Oxides 2001
Edmonds, L. Ion-Induced Stuck Bits in the 1T/1C SDRAM Cells 2001
Johnston, A. Radiation Test Results for Interpoint Power Converters 2001
Johnston, A. Proton Damage in Advanced Laser Diodes 2001
Miyahira, T. Catastrophic Latchup in CMOS Analog-to-Digital Converters 2001
Scheick, L. SEE Evaluation of Digital Analog Converters for Space Applications 2001
Scheick, L. Floating Gate Dosimetry Based on Measurement of Incremental Charge Injection 2001
Scheick, L. UVPROM Dosimetry Aboard The MPTB Satellite: Method Optimization And Implementation 2001
Swift, G. Single-Event Upset in the PowerPC750 Microprocessor 2001
Swift, G. Single Event Testing Using Heavy Ion Irradiation through Thick Layers of Material 2001
Swift, G. Investigations into Early Failures of DC-DC Converters Due to Total Dose 2001
  2000  
Conley, J. The Effects of Ionizing Radiation on Wear-out and Reliability of Thin Gate Oxides 2000
Edmonds, L. Proton SEU Cross Sections Derived from Heavy-Ion Test Data 2000
Guertin, S. Angular Dependence of DRAM Upset Susceptibility and Implrications for Testing and Analysis 2000
Johnston, A. A Model for Single-Event Transients in Comparators 2000
Johnston, A. Characterization of Proton Damage in Light-Emitting Diodes 2000
Johnston, A. Proton Damage in Linear and Digital Optocouplers 2000
Johnston, A. Radiation Damage of Electronic and Optoelectronic Devices in Space 2000
Johnston, A. The Effects of Space Radiation on Linear Integrated Circuits 2000
Johnston, A. Proton Displacement Damage in Light-Emitting and Laser Diodes 2000
Johnston, A. Scaling and Technology Issues for Soft Error Rates 2000
Johnston, A. Latchup Test Considerations for Analog-to-Digital Converters 2000
McClure, S. Dose Rate and Bias Dependency of Total Dose Sensitivity of Low Dropout Volltage Regulators 2000
Scheick, L. Measurement of the Effective Sensitive Volume of UVPROM Cells Based on Recombination Effects in Field Oxides 2000
Scheick, L. Statistical and Small Volume Analysis of Radiation Effects on Invidual DRAM Cells 2000
Scheick, L. SEU Evaluation of SRAM Memories for Space Applications 2000
Scheick, L. Phenomenological Application of Target Theory Effects on SEE Analysis 2000
Scheick, L. Analysis of Radiation Effects on Individual DRAM Cells 2000
Selva, L. Catastrophic Heavy-Ion Failure of a Commercial ASIC 2000
Swift, G. In-Flight Observations of Multiple-Bit Upset in DRAMs 2000
Swift, G. A Brief History of Memory in Space from an SEE Perspective 2000
Swift, G. Summary:Measurements of the PowerPC750 Upset Susceptibility to Protons and Heavy Ions 2000
  1999  
Barnes, C. Proton Irradiation Effects in Oxide-Confined Vertical Cavity Surface Emitting Laser (VCSEL) Diodes 1999
Barnes, C. Radiation Hardness Assurance Issues for JPL Spacecraft 1999
Edmonds, L. Radiation Response of a MEMS Accelerometer: An Electrostatic Force 1999
Guertin, S. Single-Event Upset Test Results for the Xilinx XQ1701L PROM 1999
Johnston, A. Angular and Energy Dependence of Proton Damage in Optocouplers 1999
Johnston, A. Proton Damage in Light Emitting Diodes 1999
Nguyen, D. Radiation Effects on Advanced Flash Memories 1999
Rax, B. Displacement Damage in Bipolar Linear Integrated Circuits 1999
Selva, L. Device SEE Susceptibility Update 1999
Selva, L. On the Role of Energy Deposition in Triggering SEGR in Power MOSFETs 1999
  1998  
Edmonds, L. The Influence of Spatial Variations of Diffusion Length on Charge Collected by Diffusion from Ion Tracks 1998
Edmonds, L. Electric Currents through Ion Tracks in Silicon Devices 1998
Johnston, A. Breakdown of Gate Oxides During Irradiation with Heavy Ions 1998
Johnston, A. Single-Event Upset in Optocouplers 1998
Johnston, A. Radiation Effects in Advanced Microelectronics Technologies 1998
Lee, C. Total Dose Effects on Voltage-to-Frequency Converters 1998
Lee, C. Comparison of Total Dose Effects on Micropower Op-Amps:  Bipolar and CMOS 1998
Lee, C. Comparison of Total Dose Responses on High Resolution Analog-to-Digital Converters 1998
Nguyen, D. Total Dose Effects on Flash Memories 1998
Rax, B. Proton Damage Effects in Linear Integrated Circuits 1998
Selva, L. Compendium of Single Event Failures in Power MOSFETs 1998
  1997  
Johnston, A. Latchup in Integrated Circuits from Energetic Protons 1997
Johnston, A. Single-Event Upset in Flash Memories 1997
Lee, C. Total Ionizing Dose Effects on 64-Mb 3.3-V DRAMs 1997
Rax, B. Degradation of Precision Reference Devices in Space Environments 1997
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