Name: Leif Scheick

Background: Received his B.S. in physics from Wofford College in 1992 and did his graduate work in radiation physics in semiconductor devices at Clemson University. In 1996, he received a M.S. in Physics and in 1999, he received a doctorate in Physics focusing on microdosimetric measurement using arrays of floating gates. He joined the Jet Propulsion Laboratory in 1999 and is a Senior Member of the Radiation Effects Group of the Electronic Parts Engineering Office. He has published several refereed papers, including work on Single Hard Errors in commercial DRAMs and SRAMs used on spacecraft, SEE response in mixed signal devices, and the effect of temperature on radiation response of silicon devices. He has been involved in both SEE (SEU, SEL, SEFI , SEGR) and TID testing of devices for NASA missions. He has provided radiation support for such missions as MER, Cloudsat, Picasso, Calypso, and MRO.