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September, 2010

Philippe Adell, Larry Edmonds, Leif Scheick and Steve McClure Receive Best Poster Paper Award at the RADECS

September 30th, 2010

Philippe Adell, Larry Edmonds, Leif Scheick and Steve McClure received the best poster paper award at the RADECS conference in Langenfeld, Austria. The paper is entitled: “An approach to Single Event Testing of SDRAMs”, and will be published this month in the IEEE transaction on nuclear science issue.

Katherine Whittington Will Present “Counterfeit Parts Recognition and Detection for Failure Analysts” at Inter. Symposium for Testing and Failure Analysis

September 21st, 2010

Katherine Whittington will present “Counterfeit Parts Recognition and Detection for Failure Analysts” at the International Symposium for Testing and Failure Analysis held Nov. 14 thru 18 in Dallas, Texas. Katherine is JPL’s Counterfeit Parts Specialist. She teaches a course in Counterfeit Parts Avoidance on Lab, in accordance with JPL’s Counterfeit Parts Control Program as defined […]

TID Lab Gets New High Dose Rate Co-60 Source

September 13th, 2010

The new high dose rate Co-60 source has been installed and calibrated.  This new source has higher dose rate capability by a factor of about 20.  The source also has good uniformity over the 6 in x 6 in board area generally used for TID tests. These features will permit the irradiation for a HDR […]