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November, 2010

Gary Burke, Doug Sheldon and Yuan Chen of Langley Research Center Issued Patent for “Precise Delay Measurement Through Combinatorial Logic”

November 29th, 2010

Gary Burke, Doug Sheldon and Yuan Chen of Langley Research Center were issued United States Patent Number 7,809,521 for “Precise Delay Measurement Through Combinatorial Logic”. The patent describes a high resolution circuit and method for facilitating precise measurement of on-chip delays for FPGAs for reliability studies.