Office of Safety and Mission Success Component Engineering & Assurance Office 514


February, 2011

Mark White Presented Paper “A Study of Scaling Effects on DRAM Reliability” at 2011 Reliability and Maintainability Symposium

February 3rd, 2011

Mark White presented a paper, “A Study of Scaling Effects on DRAM Reliability”, at the 2011 annual Reliability and Maintainability Symposium (RAMS) sponsored in part by AIAA and the IEEE Reliability Society. The work is significant because it reveals how failure distributions change as a function of stress conditions and life across three technology node […]