Office of Safety and Mission Success Component Engineering & Assurance Office 514


February, 2013

Dr. Mark White Presented “Reliability Considerations of Ultra-Low Power Scaled CMOS in Spacecraft Systems” at RAMS

February 6th, 2013

Dr. Mark White (5141) – TGS Parts Engineering and Reliability, and John Klohoker (5131) – TGS Product and Circuit Reliability, attended the IEEE Reliability and Maintainability Symposium (RAMS), January 28-31, 2013.  Dr. White presented a paper,  which addresses some of the performance and reliability trade-offs that must be taken into account when using advanced ULP components in […]