Philippe Adell, Greg Allen, Mehran Armbar, Rob Davies, Steve Guertin, Steve McClure, Farokh Irom, and Leif Scheick attended the 52nd Nuclear and Space Radiation Effect Conference in Boston MA on the July 13th to July 17th.
Philippe Adell gave a talk entitled: Hydrogen Limits for Total Dose and Dose Rate Response.
Greg Allen presented a poster entitled: 2015 Compendium of Recent Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory’s Radiation Effects Group.
Mehran Amrbar present a poster entitled: Heavy Ion Single Event Effects Measurements of Xilinx Zynq-7000 FPGA.
Steve Guertin presented two posters entitled: Radiation Test Results for Common Cubesat Microcontrollers and Microprocessors & Impact of Refresh on the Total Ionizing Dose Response of DRAM Stuck Bits.
Farokh Irom presented three posters entitled: Heavy Ion Single Event Effects Measurements of 512Mb ISSI SDRAM & Proton Displacement Damage Measurements in Commercial Optocouplers & Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial Digital to Analog Converters.
Leif Scheick was the instructor for a short course entitled: Design Approaches for Radiation Survivable Space Power Systems.