ASIC application-specific integrated circuit ATPG automatic test pattern generation BILBO built-in logic block observation BIST built-in self-test CAD computer-aided design CAE computer-aided engineering CAT computer-aided testing CDR critical design review CE concurrent engineering CMOS complementary metal-oxide semiconductor CPU central processing unit DESC Defense Electronics Supply Center DFT design for test DRC design rule check ECL emitter-coupled logic EDA electronic design automation industry EDAC error detection and correction EDIF electronic design interchange format ERC electronic design augomation FDL fault detection and localization FPGA field-programmable gate array GA gate array GaAs gallium-arsenide HDL hardware description language HOL high-order logic I/O input/output IEEE Institute of Electrical and Electronics Engineers JAN Joint-Army-Navy JEDEC Joint Electron Device Engineering Council JTAG Joint Test Action Group LCC leadless chip carrier LET linear energy transfer LFSR linear feedback shift register LSSD level-sensitive scan design LTPD lot tolerance percent defective NRE nonrecurring engineering (charges) PDA percent defective allowable PDR preliminary design review PG pattern-generation (tape) PGA pin grid array PM parametric monitor QCI quality conformance inspection QCRIT critical charge QML Qualified Manufacturers List QMP Quality Management Plan QPL Qualified Products List RAM random access memory ROM read-only memory RTL register-transfer level SC standard cell SEC standard evaluation circuit SEE single-event effect SEL single-event latchup SEU single-event upset SMD standardized military drawing SOI silicon-on-insulator SOS silicon-on-sapphire SOW statement of work SPC statistical process control SPICE simulation program with IC emphasis SRL shift register latch TAP test access port TCI technology conformance inspection TCV technology characterization vehicle TDDB time-dependent dielectric breakdown TID total ionizing dose TMT triple modular redundancy TQM total quality management TRB technology review board TRSL test requirements and specification language TTL transistor-transistor logic VHDL VHSIC hardware description language VHSIC very high scale integrated circuit VLSI very large scale integration WAVES waveform and vector exchange program
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